Test
Plan
* time in all interfaces
- all CLKDES1 via
scope / HDMC / data base (1)
- operate LVDS inputs at fixed global offset
from (1), all input channels forced to 0 phase, 0 delay
- FIOs via delay
scan (binary counter pattern)
- CMMs via CMM tool
(R. Booth?)
*
confirm proper operation of all interfaces of the supposedly working modules
(1*JEM1.2, 3* JEM1.3)
- LVDS via ramp of length 512 (possibly done
already)
- DAQ G-link via gLinkTest
- ROI G-link via gLinkTest
and special jet firmware (optional)
- FIOs and CMMs are done already...
* time in DAQ and ROI(?) chain
operate
full system with readout. check for errors on DAQ.
Make
sure we can check for errors on all interfaces with maximum traffic throughout
the system.
worst
case patterns :
LVDS
alternating bits
LVDS
data generating maximum concurrent switching on FIOs
ramp
pattern on FOIs
patterns
on Glinks?
Patterns on merger lines